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- [23] SILICON-WAFERS FOR INTEGRATED-CIRCUIT PROCESS REVUE DE PHYSIQUE APPLIQUEE, 1986, 21 (08): : 467 - 488
- [28] TEST DEVICE STRUCTURES FOR INTEGRATED-CIRCUIT DESIGN, PROCESS TECHNOLOGY DEVELOPMENT AND EVALUATION MICROELECTRONICS AND RELIABILITY, 1982, 22 (02): : 195 - 206