Determination of a small elliptical anomaly in electrical impedance tomography using minimal measurements

被引:0
|
作者
Chen, Gaoming [1 ]
Santosa, Fadil [2 ]
Titi, Aseel [2 ]
机构
[1] Renming Univ, Sch Math, Beijing, Peoples R China
[2] Johns Hopkins Univ, Dept Appl Math & Stat, Baltimore, MD 21218 USA
关键词
electrical impedance tomography; small conductivity anomaly; minimal measurements; optimal experiment design; INVERSE CONDUCTIVITY PROBLEM; CRACKS; UNIQUENESS; ALGORITHM;
D O I
10.1088/1361-6420/ad7d2e
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
We consider the problem of determining a small elliptical conductivity anomaly in a unit disc from boundary measurements. The conductivity of the anomaly is assumed to be a small perturbation from the constant background. A measurement of voltage across two point-electrodes on the boundary through which a constant current is passed. We further assume the limiting case when the distance between two electrodes go to zero, creating a dipole field. We show that three such measurements suffice to locate the anomaly size and location inside the disc. Two further measurements are needed to obtain the aspect ratio and the orientation of the ellipse. The investigation includes the studies of the stability of the inverse problem and optimal experiment design.
引用
收藏
页数:20
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