Atomic-force microscopy study of the surface topography and domain structure of TGS crystals with a different degree of imperfection

被引：0

作者：

Belugina, N.V. ^{[1
]}

Tolstikhina, A.L. ^{[1
]}

Shikin, S.A. ^{[1
]}

机构：

[1] A. V. Shubnikov Inst. of Crystallog., Russian Academy of Sciences, Moscow, Russia

来源：

Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 2001年 / 16卷 / 02期

关键词：

Atomic force microscopy - Crystal defects - Crystal growth - Ferroelectric materials - Surface topography;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The surface topography and domain structure of triglycin sulfate crystals have been studied by the method of atomic-force microscopy in the contact mode, the mode of lateral forces and the resonant modulation mode. Images of the polar surface of the specimens prepared under various conditions have been obtained, and its micro-relief has been measured. The effect of the cantilever on the crystal surface which led to the domain re-polarization has been found.

引用

页码：283 / 289

共 50 条

[41] Study of the surface topography of graphite materials using atomic force microscopy
Gu, JL
Leng, Y
CARBON, 1999, 37 (06) : 991 - 994
[42] Study of the surface topography of graphite materials using atomic force microscopy
Hong Kong Univ of Science and, Technology, Kowloon, Hong Kong
Carbon, 6 (991-994):
[43] Study of surface structure and dextran incorporation into sucrose crystals using atomic force microscopy
Khaddour, Issam
Rocha, Fernando
Bento, Luis
SUGAR INDUSTRY-ZUCKERINDUSTRIE, 2012, 137 (04): : 227 - 229
[44] Structure and mechanical flexibility of carbon nanotube ribbons: An atomic-force microscopy study
Yu, MF
Dyer, MJ
Ruoff, RS
JOURNAL OF APPLIED PHYSICS, 2001, 89 (08) : 4554 - 4557
[45] INVESTIGATION OF A FCC SURFACE USING ATOMIC-FORCE MICROSCOPY (AFM)
OCCELLI, ML
GOULD, SAC
DRAKE, B
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 206 : 43 - PETR
[46] Applications of atomic-force microscopy in environmental colloid and surface chemistry
Maurice, PA
COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 1996, 107 : 57 - 75
[47] METROLOGICAL SURFACE-SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPY
VASILEV, SI
MOSTEPANENKO, VM
PANOV, VI
MEASUREMENT TECHNIQUES USSR, 1990, 33 (01): : 26 - 30
[48] ATOMIC-FORCE MICROSCOPY OF THE ELECTROCHEMICAL NUCLEATION AND GROWTH OF MOLECULAR-CRYSTALS
HILLIER, AC
WARD, MD
SCIENCE, 1994, 263 (5151) : 1261 - 1264
[49] INVESTIGATION OF PHASE-BEHAVIOR AND DOMAIN-STRUCTURE OF PHOSPHOLIPID MONOLAYERS BY ATOMIC-FORCE MICROSCOPY
YANG, XM
XIAO, D
XIAO, SJ
LU, ZH
WEI, Y
CHINESE SCIENCE BULLETIN, 1994, 39 (24): : 2076 - 2080
[50] Distorted surface topography observed by atomic force microscopy
Li, LA
Liu, RP
Xu, Z
Xu, Y
Wang, WK
Fan, CZ
MEASUREMENT, 2006, 39 (01) : 12 - 15

← 1 2 3 4 5 →