Atomic-force microscopy study of the surface topography and domain structure of TGS crystals with a different degree of imperfection

被引：0
|
作者：
Belugina, N.V. [1 ]
Tolstikhina, A.L. [1 ]
Shikin, S.A. [1 ]
机构：
[1] A. V. Shubnikov Inst. of Crystallog., Russian Academy of Sciences, Moscow, Russia
来源：
Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 2001年 / 16卷 / 02期
关键词：
Atomic force microscopy - Crystal defects - Crystal growth - Ferroelectric materials - Surface topography;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The surface topography and domain structure of triglycin sulfate crystals have been studied by the method of atomic-force microscopy in the contact mode, the mode of lateral forces and the resonant modulation mode. Images of the polar surface of the specimens prepared under various conditions have been obtained, and its micro-relief has been measured. The effect of the cantilever on the crystal surface which led to the domain re-polarization has been found.
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页码：283 / 289
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