Fourier transformation of X-ray diffraction profiles

被引：0
|
作者：
Liu, Gang
Liang, Zhide
Lu, Ke
机构：
来源：
Jinshu Xuebao/Acta Metallurgica Sinica | 2002年 / 38卷 / 01期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] Simulation of X-ray diffraction profiles for bent anisotropic crystals
    20151500721703
    Sanchez Del Rio, Manuel (srio@esrf.eu), 1600, International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom (48):
  • [22] HOOK EFFECT IN ANALYSIS OF X-RAY DIFFRACTION LINE PROFILES
    AGNIHOTRI, OP
    NATURE, 1964, 203 (494) : 177 - &
  • [23] Deconvolution of X-ray diffraction profiles by using series expansion
    Sánchez-Bajo, F
    Cumbrera, FL
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2000, 33 : 259 - 266
  • [24] Simulation of X-ray diffraction profiles for bent anisotropic crystals
    del Rio, Manuel Sanchez
    Perez-Bocanegra, Nicolas
    Shi, Xianbo
    Honkimaki, Veijo
    Zhang, Lin
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015, 48 : 477 - 491
  • [25] X-RAY DIFFRACTION LINE PROFILES OF ELECTROGRAPHITIZED CARBON PRODUCTS
    NODA, T
    SUGIE, C
    INAGAKI, M
    KOGYO KAGAKU ZASSHI, 1961, 64 (12): : 2087 - &
  • [26] Simulation of X-ray diffraction profiles of gradually relaxed epilayers
    SanzHervas, A
    Abril, EJ
    Aguilar, M
    deBenito, G
    Llorente, C
    Lopez, M
    MIKROCHIMICA ACTA, 1996, : 525 - 531
  • [27] ANALYSIS OF X-RAY DIFFRACTION LINE PROFILES OF MICROCRYSTALLINE MUSCOVITES
    KODAMA, H
    GATINEAU, L
    MERING, J
    CLAYS AND CLAY MINERALS, 1971, 19 (06) : 405 - &
  • [28] X-ray diffraction profiles from axial nanowire heterostructures
    Kaganer, V. M.
    Woelz, M.
    Brandt, O.
    Geelhaar, L.
    Riechert, H.
    PHYSICAL REVIEW B, 2011, 83 (24)
  • [29] Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects
    Scardi, P
    Leoni, M
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1999, 32 : 671 - 682
  • [30] SMOOTHING AND FAST FOURIER TRANSFORMATION OF EXPERIMENTAL X-RAY AND NEUTRON-DIFFRACTION DATA FROM AMORPHOUS MATERIALS
    DIXON, M
    WRIGHT, AC
    HUTCHINSON, P
    NUCLEAR INSTRUMENTS & METHODS, 1977, 143 (02): : 379 - 383
12345