Simulation of X-ray diffraction profiles for bent anisotropic crystals

被引:0
|
作者
20151500721703
机构
[1] Sanchez Del Rio, Manuel
[2] Perez-Bocanegra, Nicolas
[3] Shi, Xianbo
[4] Honkimäki, Veijo
[5] Zhang, Lin
来源
Sanchez Del Rio, Manuel (srio@esrf.eu) | 1600年 / International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom卷 / 48期
关键词
Anisotropy;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Simulation of X-ray diffraction profiles for bent anisotropic crystals
    del Rio, Manuel Sanchez
    Perez-Bocanegra, Nicolas
    Shi, Xianbo
    Honkimaki, Veijo
    Zhang, Lin
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015, 48 : 477 - 491
  • [2] Theory of X-ray diffraction on asymmetrically cut and bent crystals
    Podorov, SG
    Förster, E
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 2000, 220 (02): : 829 - 836
  • [3] Bent crystals for diffraction enhanced X-ray imaging with a divergent source
    Sanmiguel, RE
    Kuper, K
    Besch, HJ
    Plothow-Besch, H
    MEDICAL PHYSICS, 2004, 724 : 136 - 139
  • [4] Simulation of diffraction profiles for sagittally bent Laue crystals
    Shi, Xianbo
    ADVANCES IN COMPUTATIONAL METHODS FOR X-RAY OPTICS II, 2011, 8141
  • [5] X-RAY TOPOGRAPHY OF BENT CRYSTALS
    CHUKHOVSKII, FN
    PETRASHEN, PV
    ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 : 8 - 14
  • [6] X-ray diffraction efficiency of bent GaAs mosaic crystals for the Laue project
    Ferrari, Claudio
    Buffagni, Elisa
    Bonnini, Elisa
    Zappettini, Andrea
    OPTICAL ENGINEERING, 2014, 53 (04)
  • [7] X-ray diffraction efficiency of bent GaAs mosaic crystals for the LAUE project
    Ferrari, C.
    Buffagni, E.
    Bonnini, E.
    Zappettini, A.
    OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY VI, 2013, 8861
  • [8] X-RAY PROPAGATION AND DIFFRACTION IN DISTORTED, ANISOTROPIC, DIELECTRIC AND MAGNETIC CRYSTALS
    DAVIS, TJ
    ACTA CRYSTALLOGRAPHICA SECTION A, 1995, 51 : 354 - 360
  • [9] X-ray propagation and diffraction in distorted, anisotropic, dielectric and magnetic crystals
    Davis, T.J.
    Acta Crystallographica, Section A: Foundations of Crystallography, 1995, 51 (pt 3):
  • [10] Simulation of X-ray diffraction profiles of gradually relaxed epilayers
    SanzHervas, A
    Abril, EJ
    Aguilar, M
    deBenito, G
    Llorente, C
    Lopez, M
    MIKROCHIMICA ACTA, 1996, : 525 - 531