Application of curved crystal spectrometer in measuring X-ray line

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Key Laboratory of Optoelectronic Technology and System, Chongqing University, Chongqing 400030, China [1 ]
不详 [2 ]
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Guangdianzi Jiguang | 2008年 / 9卷 / 1163-1165期
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页码：1163 / 1165
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