SIMPLE SPECTROMETER FOR MEASURING X-RAY INTEGRATED INTENSITIES

被引：0

作者：

CHANDRASEKARAN, KS ^{[1
]}

MOHANLAL, SK ^{[1
]}

DANRITA, J ^{[1
]}

机构：

[1] MADURAI UNIV, DEPT PHYS, MADURAI 2, INDIA

来源：

INDIAN JOURNAL OF PURE & APPLIED PHYSICS | 1972年 / 10卷 / 10期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：747 / 749

页数：3

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