SIMPLE SPECTROMETER FOR MEASURING X-RAY INTEGRATED INTENSITIES

被引：0
|
作者：
CHANDRASEKARAN, KS [1 ]
MOHANLAL, SK [1 ]
DANRITA, J [1 ]
机构：
[1] MADURAI UNIV, DEPT PHYS, MADURAI 2, INDIA
来源：
INDIAN JOURNAL OF PURE & APPLIED PHYSICS | 1972年 / 10卷 / 10期
关键词：
D O I：
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：747 / 749
页数：3
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