Test of the fluctuation theorem for single-electron transport

被引：0
|
作者：
Küng, B. [1 ]
Rössler, C. [1 ]
Beck, M. [2 ]
Marthaler, M. [3 ]
Golubev, D.S. [4 ]
Utsumi, Y. [5 ]
Ihn, T. [1 ]
Ensslin, K. [1 ]
机构：
[1] Küng, B.
[2] Rössler, C.
[3] Beck, M.
[4] Marthaler, M.
[5] Golubev, D.S.
[6] Utsumi, Y.
[7] Ihn, T.
[8] Ensslin, K.
来源：
| 1600年 / American Institute of Physics Inc.卷 / 113期
关键词：
Using time-resolved charge detection in a double quantum dot; we present an experimental test of the fluctuation theorem. The fluctuation theorem; a result from nonequilibrium statistical mechanics; quantifies the ratio of occurrence of fluctuations that drive a small system against the direction favored by the second law of thermodynamics. Here; these fluctuations take the form of single electrons flowing against the source-drain bias voltage across the double quantum dot. Our results; covering configurations close to as well as far from equilibrium; agree with the theoretical predictions; when the finite bandwidth of the charge detection is taken into account. In further measurements; we study a fluctuation relation that is a generalization of the Johnson-Nyquist formula and relates the second-order conductance to the voltage dependence of the noise. Current and noise can be determined with the time-resolved charge detection method. Our measurements confirm the fluctuation relation in the nonlinear transport regime of the double quantum dot. © 2013 American Institute of Physics;
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