Test of the fluctuation theorem for single-electron transport

被引：0

作者：

Küng, B. ^{[1
]}

Rössler, C. ^{[1
]}

Beck, M. ^{[2
]}

Marthaler, M. ^{[3
]}

Golubev, D.S. ^{[4
]}

Utsumi, Y. ^{[5
]}

Ihn, T. ^{[1
]}

Ensslin, K. ^{[1
]}

机构：

[1] Küng, B.

[2] Rössler, C.

[3] Beck, M.

[4] Marthaler, M.

[5] Golubev, D.S.

[6] Utsumi, Y.

[7] Ihn, T.

[8] Ensslin, K.

来源：

| 1600年 / American Institute of Physics Inc.卷 / 113期

关键词：

Using time-resolved charge detection in a double quantum dot; we present an experimental test of the fluctuation theorem. The fluctuation theorem; a result from nonequilibrium statistical mechanics; quantifies the ratio of occurrence of fluctuations that drive a small system against the direction favored by the second law of thermodynamics. Here; these fluctuations take the form of single electrons flowing against the source-drain bias voltage across the double quantum dot. Our results; covering configurations close to as well as far from equilibrium; agree with the theoretical predictions; when the finite bandwidth of the charge detection is taken into account. In further measurements; we study a fluctuation relation that is a generalization of the Johnson-Nyquist formula and relates the second-order conductance to the voltage dependence of the noise. Current and noise can be determined with the time-resolved charge detection method. Our measurements confirm the fluctuation relation in the nonlinear transport regime of the double quantum dot. © 2013 American Institute of Physics;

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摘要：

Conference article (CA)

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