Atomic precision advanced manufacturing for digital electronics

被引：0
|
作者：
Ward, Daniel R. [1 ]
Schmucker, Scott W. [1 ]
Anderson, Evan M. [1 ]
Bussmann, Ezra [1 ]
Tracy, Lisa [1 ]
Lu, Tzu-Ming [1 ]
Maurer, Leon N. [1 ]
Baczewski, Andrew [1 ]
Campbell, Deanna M. [1 ]
Marshall, Michael T. [1 ]
Misra, Shashank [1 ]
机构：
[1] Sandia National Laboratories, Albuquerque,NM, United States
来源：
Electronic Device Failure Analysis | 2020年 / 22卷 / 01期
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页码：4 / 10
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