Atomic precision advanced manufacturing for digital electronics

被引：0

作者：

Ward, Daniel R. ^{[1
]}

Schmucker, Scott W. ^{[1
]}

Anderson, Evan M. ^{[1
]}

Bussmann, Ezra ^{[1
]}

Tracy, Lisa ^{[1
]}

Lu, Tzu-Ming ^{[1
]}

Maurer, Leon N. ^{[1
]}

Baczewski, Andrew ^{[1
]}

Campbell, Deanna M. ^{[1
]}

Marshall, Michael T. ^{[1
]}

Misra, Shashank ^{[1
]}

机构：

[1] Sandia National Laboratories, Albuquerque,NM, United States

来源：

Electronic Device Failure Analysis | 2020年 / 22卷 / 01期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：4 / 10

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