Focus on test, measurement, quantum metrology, and analytical equipment

被引：0

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作者：

Mandelis, Andreas

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来源：

PHYSICS TODAY | 2024年 / 77卷 / 06期

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D O I：

10.1063/pt.sfgb.umnn

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

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页码：51 / 52

页数：2

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