Focus on test, measurement, quantum metrology, and analytical equipment

被引：0

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作者：

Mandelis, Andreas

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来源：

PHYSICS TODAY | 2025年 / 78卷 / 02期

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D O I：

10.1063/pt.rnwv.fuql

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

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页码：53 / 53

页数：1

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