Focus on test, measurement, quantum metrology, and analytical equipment

被引:0
|
作者
Mandelis, Andreas
机构
关键词
D O I
10.1063/pt.sfgb.umnn
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:51 / 52
页数:2
相关论文
共 50 条
  • [31] Test and measurement equipment markets to improve
    不详
    OPTICS AND LASER TECHNOLOGY, 1997, 29 (07): : VI - VI
  • [32] Noisy Quantum Metrology Enhanced by Continuous Nondemolition Measurement
    Rossi, Matteo A. C.
    Albarelli, Francesco
    Tamascelli, Dario
    Genoni, Marco G.
    PHYSICAL REVIEW LETTERS, 2020, 125 (20)
  • [33] Measurement of Geometrical Quantities with focus on Co-ordinate Measurement Techniques Manufacturing Metrology
    Weckenmann, Albert
    MEASUREMENT, 2012, 45 (10) : 2281 - 2282
  • [34] ANALYTICAL METROLOGY
    BLYUM, IA
    INDUSTRIAL LABORATORY, 1976, 42 (11): : 1645 - 1655
  • [35] tqix: A toolbox for Quantum in x x: Quantum measurement, quantum tomography, quantum metrology, and others
    Le Bin Ho
    Kieu Quang Tuan
    Nguyen, Hung Q.
    COMPUTER PHYSICS COMMUNICATIONS, 2021, 263
  • [36] Measurement-based quantum correlation in mixed-state quantum metrology
    Uman Khalid
    Youngmin Jeong
    Hyundong Shin
    Quantum Information Processing, 2018, 17
  • [37] Measurement-based quantum correlation in mixed-state quantum metrology
    Khalid, Uman
    Jeong, Youngmin
    Shin, Hyundong
    QUANTUM INFORMATION PROCESSING, 2018, 17 (12)
  • [38] Testing and metrology focus
    Quality World, 1994, 20 (01):
  • [39] An efficient test method for harmonic measurement equipment
    Arseneau, R
    Filipski, PS
    8TH INTERNATIONAL CONFERENCE ON HARMONICS AND QUALITY OF POWER, PROCEEDINGS, VOLS 1 AND 2, 1998, : 233 - 237
  • [40] A test and measurement station for digital control equipment
    Xiao, TJ
    Fang, W
    Huang, JW
    ICEMI '97 - CONFERENCE PROCEEDINGS: THIRD INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, 1997, : 455 - 457