Experimental and theoretical studies on self-diffusion in amorphous germanium

被引:1
|
作者
Boeckendorf, Tim [1 ]
Kirschbaum, Jan [1 ]
Kipke, Felix [1 ]
Bougeard, Dominique [2 ]
Hansen, John Lundsgaard [3 ]
Larsen, Arne Nylandsted [3 ]
Posselt, Matthias [4 ]
Bracht, Hartmut [1 ]
机构
[1] Univ Munster, Inst Mat Phys, D-48149 Munster, Germany
[2] Univ Regensburg, Inst Expt & Angew Phys, D-93040 Regensburg, Germany
[3] Aarhus Univ, Dept Phys & Astron, D-8000 Aarhus, Denmark
[4] Helmholtz Zentrum Dresden Rossendorf, D-01328 Dresden, Germany
关键词
CRYSTALLIZATION; KINETICS; SILICON;
D O I
10.1063/5.0183578
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Self-diffusion in amorphous germanium is studied at temperatures between 325 and 370 degrees C utilizing amorphous isotopically controlled germanium multilayer structures. The isotope multilayer is epitaxially grown on a single crystalline germanium-on-insulator structure by means of molecular beam epitaxy and subsequently amorphized by self-ion implantation. After heat treatment, the diffusional broadening of the isotope structure is measured with time-of-flight secondary ion mass spectrometry. The temperature dependence of self-diffusion is accurately described by the Arrhenius equation with the activation enthalpy Q = (2.21 +/- 0.12) eV and pre-exponential factor D-0 = (2.32(-2.10)(+20.79)) cm(2) s(-1). The activation enthalpy equals the activation enthalpy of solid phase epitaxial recrystallization (SPER). This agreement suggests that self-diffusion in amorphous germanium is similar to SPER, also mainly mediated by local bond rearrangements. Classical molecular dynamics simulations with a modified Stillinger-Weber-type interatomic potential yield results that are consistent with the experimental data and support the proposed atomic mechanism.
引用
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页数:8
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