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- [31] Mechanical breakdown of aged insulating paper around continuously transposed conductors for power transformers under the influence of short-circuit forces - Analysis by numerical simulations 2015 IEEE ELECTRICAL INSULATION CONFERENCE (EIC), 2015, : 401 - 406
- [34] Gate-damage safe failure-mode deep analysis under short-circuit operation of 1.2kV and 1.7kV power SiC MOSFET using dedicated gate-source/drain-source voltage depolarization and damage-mode optical imaging 2022 IEEE WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS IN EUROPE (WIPDA EUROPE), 2022,