The critical current irreversibility of Bi(2223)/Ag tape and its modification

被引：0
|
作者：
兰玉成
郭树权
肖业皋
叶斌
曾荣
周怡茹
机构：
[1] National Laboratory for Superconductivity
[2] Institute of Physics
[3] Chinese Academy of Sciences
[4] Beijing
[5] China
[6] General Research Insitute for Non-ferrous Metal
[7] Beijing
来源：
ScienceinChina,SerA. | 1996年 / Ser.A.1996卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O482 [固体性质];
学科分类号：
摘要：
<正> The critical currents of Bi(2223)/Ag tape at magnetic fields up to 2.5T have been measured at different field orientations. The IC values depend on the history of magnetic fields. This phenomenon can be explained in terms of irreversibility of the effective magnetic field caused by the induced persistent current and the screening persistent current. If the mean of the increasing and the decreasing applied field (Hap), defined as the effective field (Hcff), is linearly related to the applied field, i.e. Heff, using Heff instead of Hap, the modified IC(H) curves curves are obtainable.
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页码：108 / 112
页数：5
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