Deep-UV fluorescence lifetime imaging microscopy

被引：0

作者：

Christiaan Jde Jong ^{[1
,2
]}

Alireza Lajevardipour ^{[1
]}

Mindaugas Geceviius ^{[3
]}

Martynas Beresna ^{[3
]}

Gediminas Gervinskas ^{[1
,4
]}

Peter GKazansky ^{[3
]}

Yves Bellouard ^{[5
]}

Andrew HAClayton ^{[1
]}

Saulius Juodkazis ^{[1
,4
,6
]}

机构：

[1] Centre for Micro-Photonics, Faculty of Science, Engineering and Technology, Swinburne University of Technology

[2] Department of Mechanical Engineering, Eindhoven University of Technology

[3] Optoelectronics Research Centre, University of Southampton

[4] Melbourne Centre for Nanofabrication

[5] Ecole Polytechnique Fédérale de Lausanne, Rue de la Maladiére b

[6] Center for Nanotechnology, King Abdulaziz

来源：

Photonics Research | 2015年 / 05期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A novel fluorescence lifetime imaging microscopy(FLIM) working with deep UV 240–280 nm wavelength excitations has been developed. UV-FLIM is used for measurement of defect-related fluorescence and its changes upon annealing from femtosecond laser-induced modifications in fused silica. This FLIM technique can be used with microfluidic and biosamples to characterize temporal characteristics of fluorescence upon UV excitation, a capability easily added to a standard microscope-based FLIM. UV-FLIM was tested to show annealing of the defects induced by silica structuring with ultrashort laser pulses. Frequency-domain fluorescence measurements were converted into the time domain to extract long fluorescence lifetimes from defects in silica.

引用

页码：283 / 288

页数：6

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