Perovskite films for X-ray detection

被引：0

作者：

Pei Yuan ^{[1
]}

Lixiu Zhang ^{[2
]}

Menghua Zhu ^{[1
]}

Liming Ding ^{[2
]}

机构：

[1] State Key Laboratory of Solidification Processing, Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering, Northwestern Polytechnical University

[2] Center for Excellence in Nanoscience (CAS), Key Laboratory of Nanosystem and Hierarchical Fabrication (CAS), National Center for Nanoscience and Technology

来源：

Journal of Semiconductors | 2022年 / 43卷 / 07期

基金：

中国国家自然科学基金;

关键词：

D O I：

暂无

中图分类号：

O434.19 [应用]; TB383.2 [];

学科分类号：

摘要：

X-ray detection is widely used in research[1-3], product inspection[4], nuclear station, and medical imaging. Si[5], α-Se[6],PbI2[7], and CdZnTe[8]are conventional semiconductors, and some problems limit their applications. For instance,

引用

页码：7 / 10

页数：4

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