Perovskite films for X-ray detection

被引：0
|
作者：
Pei Yuan [1 ]
Lixiu Zhang [2 ]
Menghua Zhu [1 ]
Liming Ding [2 ]
机构：
[1] State Key Laboratory of Solidification Processing, Key Laboratory of Radiation Detection Materials and Devices, School of Materials Science and Engineering, Northwestern Polytechnical University
[2] Center for Excellence in Nanoscience (CAS), Key Laboratory of Nanosystem and Hierarchical Fabrication (CAS), National Center for Nanoscience and Technology
来源：
Journal of Semiconductors | 2022年 / 43卷 / 07期
基金：
中国国家自然科学基金;
关键词：
D O I：
暂无
中图分类号：
O434.19 [应用]; TB383.2 [];
学科分类号：
摘要：
X-ray detection is widely used in research[1-3], product inspection[4], nuclear station, and medical imaging. Si[5], α-Se[6],PbI2[7], and CdZnTe[8]are conventional semiconductors, and some problems limit their applications. For instance,
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页码：7 / 10
页数：4
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