STUDY OF SUBSTRUCTURE OF SILICON-IRON BY X-RAY TOPOGRAPHY METHOD

被引：0
|
作者：
CHERNIKO.NV
机构：
来源：
FIZIKA METALLOV I METALLOVEDENIE | 1972年 / 34卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：655 / &
相关论文
共 50 条
  • [41] A X-RAY TOPOGRAPHY INVESTIGATION OF THE MICRODEFORMATION OF ORIENTED BICRYSTALS OF SILICON
    GEORGE, A
    JACQUES, A
    MICHEL, JP
    ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 : C320 - C320
  • [42] Nondestructive diagnostics of microchannel (Macroporous) silicon by X-ray topography
    E. V. Astrova
    A. D. Remenyuk
    A. G. Tkachenko
    I. L. Shul’pina
    Technical Physics Letters, 2000, 26 : 1087 - 1090
  • [43] X-RAY ANOMALOUS TRANSMISSION AND TOPOGRAPHY OF OXYGEN PRECIPITATION IN SILICON
    PATEL, JR
    JOURNAL OF APPLIED PHYSICS, 1973, 44 (09) : 3903 - 3906
  • [44] CHARACTERIZATION OF SILICON SURFACE LAYER STRUCTURE BY X-RAY TOPOGRAPHY
    WANG, P
    PINK, F
    APPLIED SPECTROSCOPY, 1968, 22 (04) : 372 - &
  • [45] Synchrotron X-ray topography of bismuth silicon oxide crystals
    MartinezLopez, J
    GonzalezManas, M
    Caballero, MA
    Dieguez, E
    Capelle, B
    JOURNAL OF CRYSTAL GROWTH, 1996, 166 (1-4) : 325 - 328
  • [46] X-RAY STRESS TOPOGRAPHY OF THIN FILMS ON GERMANIUM AND SILICON
    SCHWUTTK.GH
    HOWARD, JK
    JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1581 - &
  • [47] X-Ray Topography Study of Microsegregation in Crystals
    Prokhorov, I. A.
    Bezbakh, I. Z.
    Zakharov, B. G.
    Shul'pina, I. L.
    JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES, 2007, 1 (03) : 260 - 264
  • [48] X-ray topography study of microsegregation in crystals
    I. A. Prokhorov
    I. Z. Bezbakh
    B. G. Zakharov
    I. L. Shul’pina
    Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2007, 1 : 260 - 264
  • [49] A new method to quantify X-ray substructure in clusters of galaxies
    Andrade-Santos, Felipe
    Lima Neto, Gastao B.
    Lagana, Tatiana F.
    X-RAY ASTRONOMY-2009: PRESENT STATUS, MULTI-WAVELENGTH APPROACH AND FUTURE PERSPECTIVES, PROCEEDINGS, 2010, 1248 : 285 - 286
  • [50] X-RAY TOPOGRAPHY OF MAGNETIC DOMAINS IN IRON WHISKER CRYSTALS
    NAGAKURA, S
    CHIKAURA, Y
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1971, 30 (02) : 495 - &
12345