STUDY OF SUBSTRUCTURE OF SILICON-IRON BY X-RAY TOPOGRAPHY METHOD

被引：0

作者：

CHERNIKO.NV

机构：

来源：

FIZIKA METALLOV I METALLOVEDENIE | 1972年 / 34卷 / 03期

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中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：655 / &

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[21] INVESTIGATION OF THE GROWTH STRIATIONS IN SILICON BY X-RAY TOPOGRAPHY
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