THE INFLUENCE OF SURFACE-ROUGHNESS ON THE ELECTRICAL-RESISTIVITY OF EVAPORATED COPPER-FILMS

被引：0

作者：

GEBHARDT, R

LANG, M

WISSMANN, P

机构：

[1] Univ Erlangen-Nuernberg, Erlangen, West Ger, Univ Erlangen-Nuernberg, Erlangen, West Ger

来源：

VAKUUM-TECHNIK | 1986年 / 35卷 / 07期

关键词：

D O I：

暂无

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

引用

页码：199 / 202

页数：4

共 50 条

[41] THICKNESS DEPENDENCE OF ELECTRICAL-RESISTIVITY OF VACUUM-EVAPORATED ERBIUM THIN-FILMS - REPLY
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[50] ELECTRICAL-RESISTIVITY OF COPPER, GOLD, PALLADIUM, AND SILVER
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