THE INFLUENCE OF SURFACE-ROUGHNESS ON THE ELECTRICAL-RESISTIVITY OF EVAPORATED COPPER-FILMS

被引：0
|
作者：
GEBHARDT, R
LANG, M
WISSMANN, P
机构：
[1] Univ Erlangen-Nuernberg, Erlangen, West Ger, Univ Erlangen-Nuernberg, Erlangen, West Ger
来源：
VAKUUM-TECHNIK | 1986年 / 35卷 / 07期
关键词：
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
13
引用
收藏
页码：199 / 202
页数：4
相关论文
共 50 条
  • [21] THICKNESS DEPENDENCE OF ELECTRICAL-RESISTIVITY OF VACUUM-EVAPORATED ERBIUM THIN-FILMS
    SAXENA, U
    SRIVASTAVA, ON
    THIN SOLID FILMS, 1976, 31 (03) : L11 - L14
  • [22] Surface roughness modulated resistivity in copper thin films
    HongKang Song
    Ke Xia
    Jiang Xiao
    Science China(Physics,Mechanics & Astronomy), 2018, (10) : 74 - 81
  • [23] Surface roughness modulated resistivity in copper thin films
    Song, HongKang
    Xia, Ke
    Xiao, Jiang
    SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2018, 61 (10)
  • [24] Surface roughness modulated resistivity in copper thin films
    HongKang Song
    Ke Xia
    Jiang Xiao
    Science China Physics, Mechanics & Astronomy, 2018, 61
  • [25] RESISTIVITY OF SINGLE-CRYSTAL COPPER-FILMS
    FEDER, J
    RUDOLF, P
    WISSMANN, P
    THIN SOLID FILMS, 1976, 36 (01) : 183 - 186
  • [26] ELECTRICAL-RESISTIVITY AND THERMOELECTRIC-POWER OF COPPER-GERMANIUM FILMS
    NATH, P
    CHOPRA, KL
    THIN SOLID FILMS, 1979, 58 (02) : 339 - 343
  • [27] INFLUENCE OF OXYGEN ANNEALING ON ELECTRICAL-RESISTIVITY AND SURFACE SCATTERING OF ELECTRONS IN COPPER WHISKERS AT 4.2 K
    THUMMES, G
    MENDE, HH
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 26 (01): : 243 - 251
  • [28] THE INFLUENCE OF SURFACE-ROUGHNESS ON THE SERS OF PYRIDINE ON COPPER AND SILVER SURFACES
    MO, Y
    MORKE, I
    WACHTER, P
    HELVETICA PHYSICA ACTA, 1984, 57 (04): : 487 - 488
  • [29] THE ELECTRICAL-RESISTIVITY OF GOLD-FILMS
    SAMBLES, JR
    ELSOM, KC
    JARVIS, DJ
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1982, 304 (1486): : 365 - +
  • [30] ELECTRICAL-RESISTIVITY OF THIN PALLADIUM FILMS
    SHIVAPRASAD, SM
    UDACHAN, LA
    ANGADI, MA
    PHYSICS LETTERS A, 1980, 78 (02) : 187 - 188
12345