EFFECT OF ENDLESS BURN-IN ON RELIABILITY GROWTH PROJECTIONS

被引：0
|
作者：
BEZAT, AG
MONTAGUE, LL
机构：
来源：
PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM | 1979年 / NSYM期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：392 / 397
页数：6
相关论文
共 50 条
  • [11] Burn-in, burn-in: dc inferno
    Breed, Paul
    EDN, 2009, 54 (24) : 56 - 56
  • [12] BURN-IN OPTIMIZATION UNDER RELIABILITY AND CAPACITY RESTRICTIONS
    CHI, DH
    KUO, W
    IEEE TRANSACTIONS ON RELIABILITY, 1989, 38 (02) : 193 - 198
  • [13] DEVICE RELIABILITY DEMANDS BURN-IN TEST.
    Parsons, Ron
    New Electronics, 1986, 19 (18):
  • [14] How burn-in can reduce quality and reliability
    Jordan, J
    Pecht, M
    INSTITUTE OF ENVIRONMENTAL SCIENCES 1996 PROCEEDINGS - PRODUCT RELIABILITY DESIGN, TEST, AND EVALUATION, 1996, : 16 - 19
  • [15] MONITORED BURN-IN IMPROVES VLSI IC RELIABILITY
    CAMPBELL, M
    COMPUTER DESIGN, 1985, 24 (04): : 143 - &
  • [16] CMOS IC reliability indicators and burn-in economics
    Righter, AW
    Hawkins, CF
    Soden, JM
    Maxwell, P
    INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, : 194 - 203
  • [17] A unified model incorporating yield, burn-in, and reliability
    Kim, KO
    Kuo, W
    NAVAL RESEARCH LOGISTICS, 2004, 51 (05) : 704 - 719
  • [18] Burn-in temperature projections for deep sub-micron technologies
    Semenov, O
    Vassighi, AN
    Sachdev, M
    Keshavarzi, A
    Hawkins, CF
    INTERNATIONAL TEST CONFERENCE 2003, PROCEEDINGS, 2003, : 95 - 104
  • [19] MONITORED BURN-IN IMPROVES VLSI IC RELIABILITY.
    Campbell, Michael
    Electronic Systems Technology and Design/Computer Design's, 1985, 25 (04): : 143 - 144
  • [20] Burn-in
    Block, HW
    Savits, TH
    STATISTICAL SCIENCE, 1997, 12 (01) : 1 - 13
12345