SINGLE-STEP OPTICAL LIFT-OFF PROCESS

被引:166
|
作者
HATZAKIS, M
CANAVELLO, BJ
SHAW, JM
机构
关键词
D O I
10.1147/rd.244.0452
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:452 / 460
页数:9
相关论文
共 50 条
  • [41] MICROGRAVITY SEEKS LIFT-OFF
    DICKSON, D
    SCIENCE, 1986, 232 (4752) : 817 - 817
  • [42] Thick film MEMS process using reverse lift-off
    Takase, S.
    Yamada, K.
    Nakagawa, Y.
    Oka, C.
    Sakurai, J.
    Hata, S.
    MICROELECTRONIC ENGINEERING, 2023, 281
  • [43] 4 Inch lift-off process by trilayer nanoimprint lithography
    Tallal, J
    Berton, K
    Gordon, M
    Peyrade, D
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (06): : 2914 - 2919
  • [44] LIFT-OFF PROCESS FOR ACHIEVING FINE-LINE METALLIZATION
    MILGRAM, AA
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02): : 490 - 493
  • [45] Nanoimprint and lift-off process using poly(vinyl alcohol)
    Nakamatsu, K
    Tone, K
    Matsui, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (11): : 8186 - 8188
  • [46] Modification of photoresist profile in lift-off process for MEMS application
    Nagarajan, R
    Kumar, R
    NANO- AND MICROTECHNOLOGY: MATERIALS, PROCESSES, PACKAGING, AND SYSTEMS, 2002, 4936 : 159 - 167
  • [47] Dry film process development for electroplating and lift-off of metal
    Kanikella, Phaninder R.
    O'Keefe, Matthew J.
    Kim, Chang-Soo
    MICROMACHINING AND MICROFABRICATION PROCESS TECHNOLOGY XIII, 2008, 6882
  • [48] Low Cost Lift-off Process Optimization for MEMS Applications
    Pandey, Shilpi
    Bansal, Deepak
    Panwar, Deepak
    Shukla, Neha
    Kumar, Arvind
    Kothari, Prateek
    Verma, Seema
    Rangra, K. J.
    2ND INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES: MICRO TO NANO 2015 (ETMN-2015), 2016, 1724
  • [49] Thick film patterning by lift-off process using double-coated single photoresists
    Fu, Yifeng
    Ye, Li-Lei
    Liu, Johan
    MATERIALS LETTERS, 2012, 76 : 117 - 119
  • [50] LIFT-OFF FOR THE SPACE REVOLUTION
    Klerkx, Greg
    NEW SCIENTIST, 2010, 207 (2774) : 40 - 43