OPTICAL CONSTANTS OF THIN FILMS, A NEW APPROACH

被引:0
|
作者
HANSEN, WN
机构
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:143 / &
相关论文
共 50 条
  • [41] THE OPTICAL CONSTANTS OF THIN METALLIC FILMS DEPOSITED BY EVAPORATION
    CLEGG, PL
    PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1952, 65 (394): : 774 - 781
  • [42] EFFECTIVE OPTICAL CONSTANTS OF THIN GRANULAR SILVER FILMS
    SHKLYARE.IN
    KORNEEVA, TI
    ZOZULYA, KN
    OPTICS AND SPECTROSCOPY-USSR, 1969, 27 (02): : 174 - &
  • [43] Optical constants and structural properties of thin gold films
    Yakubovsky, Dmitry I.
    Arsenin, Aleksey V.
    Stebunov, Yury V.
    Fedyanin, Dmitry Yu.
    Volkov, Valentyn S.
    OPTICS EXPRESS, 2017, 25 (21): : 25574 - 25587
  • [44] Ellipsometric spectra and optical constants of PLZT thin films
    Mo, D
    Li, QJ
    Zhu, DR
    Li, HQ
    Zhang, YL
    Tang, ZF
    Liu, Y
    Wong, SP
    Xu, YH
    Mackenzie, JD
    FERROELECTRICS, 1999, 229 (1-4) : 123 - 130
  • [45] DETERMINATION OF OPTICAL CONSTANTS OF THIN FILMS DURING THEIR GROWTH
    ABELES, F
    WILMANNS, I
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (11) : 1571 - &
  • [46] DETERMINATION OF SPATIAL DISTRIBUTIONS OF THICKNESS AND OPTICAL-CONSTANTS OF THIN-FILMS BY A NEW OPTICAL TECHNIQUE
    MISHIMA, T
    KAO, KC
    APPLIED OPTICS, 1981, 20 (21): : 3719 - 3722
  • [47] Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model
    Franta, D
    Ohlídal, I
    Frumar, M
    Jedelsky, J
    APPLIED SURFACE SCIENCE, 2003, 212 : 116 - 121
  • [48] NEW ELLIPSOMETRIC METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS AND SURFACES
    SOM, SC
    CHOWDHURY, C
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1972, 62 (01) : 10 - +
  • [49] The optical constants of cubic and hexagonal boron nitride thin films and their relation to the bulk optical constants
    Stenzel, O
    Hahn, J
    Roder, M
    Ehrlich, A
    Prause, S
    Richter, F
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1996, 158 (01): : 281 - 287
  • [50] Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach
    Zhou Yi
    Wu Guo-Song
    Dai Wei
    Li Hong-Bo
    Wang Ai-Ying
    ACTA PHYSICA SINICA, 2010, 59 (04) : 2356 - 2363