DETERMINATION OF OPTICAL CONSTANTS OF THIN FILMS DURING THEIR GROWTH

被引：0
|
作者：
ABELES, F
WILMANNS, I
机构：
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1965年 / 55卷 / 11期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1571 / &
相关论文
共 50 条
  • [1] DETERMINATION OF THE OPTICAL CONSTANTS OF THIN FILMS
    ROUARD, P
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1956, 46 (05) : 370 - 370
  • [2] Determination of optical constants of thin films in the EUV
    Ciesielski, Richard
    Saadeh, Qais
    Philipsen, Vicky
    Opsomer, Karl
    Soulie, Jean-Philippe
    Wu, Meiyi
    Naujok, Philipp
    van de Kruijs, Robbert W. E.
    Detavernier, Christophe
    Kolbe, Michael
    Scholze, Frank
    Soltwisch, Victor
    APPLIED OPTICS, 2022, 61 (08) : 2060 - 2078
  • [3] On the determination of the optical constants of very thin metallic films
    Gushterova, P.
    Sharlandrev, P.
    FUNCTIONAL PROPERTIES OF NANOSTRUCTURED MATERIALS, 2006, 223 : 379 - +
  • [4] On-site determination of optical constants for thin films
    Xie Mao-Bin
    Wu Zhi-Yong
    Cui Heng-Yi
    Zhao Xin-Chao
    Xuan Zhi-Yi
    Liu Qing-Quan
    Liu Feng
    Sun Liao-Xin
    Wang Shao-Wei
    JOURNAL OF INFRARED AND MILLIMETER WAVES, 2022, 41 (05) : 888 - 893
  • [5] On the determination of the optical constants of very thin (λ/50) films
    Gushterova, P
    Sharlandjiev, P
    Schmidt, B
    Pham, M
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2005, 7 (01): : 305 - 308
  • [6] DETERMINATION OF OPTICAL-CONSTANTS OF THIN ABSORBING FILMS
    TOMLIN, SG
    THIN SOLID FILMS, 1972, 13 (02) : 265 - 268
  • [7] Determination of optical constants of thin films from transmittance trace
    Bhattacharyya, S. R.
    Gayen, R. N.
    Paul, R.
    Pal, A. K.
    THIN SOLID FILMS, 2009, 517 (18) : 5530 - 5536
  • [8] DETERMINATION OF OPTICAL-CONSTANTS OF REAL THIN-FILMS
    SZCZYRBOWSKI, J
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1978, 11 (04) : 583 - 593
  • [9] Determination of interference-free optical constants of thin films
    Mahanty, S
    Basak, D
    Merino, JM
    Leon, M
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 68 (02): : 72 - 75
  • [10] A computer program for determination of thin films thickness and optical constants
    Caricato, AP
    Fazzi, A
    Leggieri, G
    APPLIED SURFACE SCIENCE, 2005, 248 (1-4) : 440 - 445
12345