UHV-STM FOR CLEAVED SAMPLE

被引：0
|
作者：
TOKUMOTO, H [1 ]
MIKI, K [1 ]
OKAYAMA, S [1 ]
MURAKAMI, H [1 ]
WAKIYAMA, S [1 ]
ANDO, K [1 ]
机构：
[1] SEIKO INSTRUMENTS INC,ELECTROTECH LAB,TOKYO,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1990年 / 39卷 / 04期
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D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：287 / 287
页数：1
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