HIGH-RESOLUTION THERMIONIC CATHODE SCANNING TRANSMISSION ELECTRON-MICROSCOPE

被引：34
|
作者：
BROERS, AN [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
APPLIED PHYSICS LETTERS | 1973年 / 22卷 / 11期
关键词：
D O I：
10.1063/1.1654527
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：610 / 612
页数：3
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