HIGH-RESOLUTION THERMIONIC CATHODE SCANNING TRANSMISSION ELECTRON-MICROSCOPE

被引：34

作者：

BROERS, AN ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

APPLIED PHYSICS LETTERS | 1973年 / 22卷 / 11期

关键词：

D O I：

10.1063/1.1654527

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：610 / 612

页数：3

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