共 50 条
- [41] ELECTRON-BEAM INDUCED CURRENT TECHNIQUE USING A SCANNING AUGER MICROPROBE REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (07): : 1129 - 1131
- [43] Electron-beam induced current profiles for thin film heterojunction analysis POLYCRYSTALLINE SEMICONDUCTORS IV - PHYSICS, CHEMISTRY AND TECHNOLOGY, 1996, 51-5 : 527 - 532
- [45] ELECTRON-BEAM INDUCED CURRENT AND ITS APPLICATION FOR SEMICONDUCTOR STRUCTURE CHARACTERIZATION IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1992, 56 (03): : 31 - 44
- [49] ASYMMETRIC OVERHANG IN ELECTRON-BEAM RESIST BY DIRECT WRITING FOR A RECESSED-OFFSET-GATE GAAS-MESFET FUJITSU SCIENTIFIC & TECHNICAL JOURNAL, 1987, 23 (02): : 119 - 124