Complex dielectric function of CdTe/GaAs thin films studied by spectroscopic ellipsometry

被引：0
|
作者：
Jeen, Gwangsoo [1 ]
Jo, Jaehyuk [1 ]
Park, Hyoyeol [2 ]
机构：
[1] Busan Natl Univ, Dept Phys, Busan 680749, South Korea
[2] Ulsan Coll, Dept Semicond Applicat, Ulsan 680749, South Korea
来源：
JOURNAL OF THE KOREAN CRYSTAL GROWTH AND CRYSTAL TECHNOLOGY | 2005年 / 15卷 / 04期
关键词：
CdTe thin film; Spectroscopic ellipsomerty; Dielectric function;
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
Spectroscopic ellipsomerty measurements of the complex dielectric function of the CdTe thin films grown on GaAs(100) substrates by hot wall epitaxy have been performed in 1.5-5.5 eV photon energy range at room temperature. The spectroscopic ellipsometer spectra revealed distinct structures at energies of the E-1,E-1 + Delta(1)and E-2 critical points. These energies were decreased with increasing thickness of CdTe thin films.
引用
收藏
页码：157 / 161
页数：5
相关论文
共 50 条
  • [31] Complex dielectric function of biaxial tensile strained silicon by spectroscopic ellipsometry
    Vineis, CJ
    PHYSICAL REVIEW B, 2005, 71 (24):
  • [32] Spectroscopic ellipsometry for polymer thin films
    Hilfiker, JN
    Synowicki, RA
    Bungay, CL
    Carpio, R
    SOLID STATE TECHNOLOGY, 1998, 41 (10) : 101 - +
  • [33] Characterization of inhomogeneous dielectric films by spectroscopic ellipsometry
    Rivory, J
    THIN SOLID FILMS, 1998, 313 : 333 - 340
  • [34] Optical properties of hydrogenated ZnO-Ga thin films studied by spectroscopic ellipsometry
    Yang Jiao
    Gao Mei-Zhen
    JOURNAL OF INFRARED AND MILLIMETER WAVES, 2016, 35 (01) : 6 - 10
  • [35] Polarization behavior of zinc oxide thin films studied by temperature dependent spectroscopic ellipsometry
    Kurniawan, Robi
    Sutjahja, Inge Magdalena
    Winata, Toto
    Herng, Tun Seng
    Ding, Jun
    Rusydi, Andrivo
    Darma, Yudi
    OPTICAL MATERIALS EXPRESS, 2017, 7 (11): : 3902 - 3908
  • [36] Optical and dielectric results of Y0.225Sr0.775CoO3±δ thin films studied by spectroscopic ellipsometry technique
    Ali, A. I.
    Son, J. Y.
    Ammar, A. H.
    Moez, A. Abdel
    Kim, Y. S.
    RESULTS IN PHYSICS, 2013, 3 : 167 - 172
  • [37] Optical properties of GaAs0.9-xNxSb0.1 alloy films studied by spectroscopic ellipsometry
    Ben Sedrine, N.
    Bouhafs, C.
    Schubert, M.
    Harmand, J. C.
    Chtourou, R.
    Darakchieva, V.
    THIN SOLID FILMS, 2011, 519 (09) : 2838 - 2842
  • [38] Bromine and alkoxyl substituted copper phthalocyanine derivative thin films studied with spectroscopic ellipsometry
    Wu, YQ
    Gu, DH
    Gan, FX
    OPTICAL MATERIALS, 2003, 24 (03) : 477 - 482
  • [39] Optical properties of Ge-doped ZnO thin films studied with spectroscopic ellipsometry
    Baek, Seoung Ho
    Lee, Do Kyu
    Kang, Tae Dong
    Choi, Suk-Ho
    Lee, Hosun
    Eom, Seung Hwan
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2008, 53 (01) : 451 - 460
  • [40] Real time spectroscopic ellipsometry of sputtered CdTe, CdS, and CdTe1-xSx thin films for photovoltaic applications
    Li, Jian
    Podraza, N. J.
    Collins, R. W.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2008, 205 (04): : 901 - 904
12345