共 50 条
- [1] ANALYSIS OF CONDUCTING AND INSULATING SURFACES BY MEANS OF SECONDARY ION MASS-SPECTROMETRY (SIMS) ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1975, 30 (6-7): : 831 - 834
- [4] SECONDARY ION MASS-SPECTROMETRY (SIMS) PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1984, 8 (1-2): : 11 - 57
- [5] MOLECULAR SECONDARY ION MASS-SPECTROMETRY (SIMS) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 737 - 747
- [7] ANALYSIS OF HYDROGEN IN METALS BY SECONDARY ION MASS-SPECTROMETRY (SIMS) ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE NEUE FOLGE, 1986, 147 : 35 - 45
- [9] ANALYSIS OF DEPTH DISTRIBUTION OF DOPANTS BY SECONDARY ION MASS-SPECTROMETRY (SIMS) SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1985, 14 (04): : 208 - 215