ANALYSIS FOR LITHIUM BY SECONDARY ION MASS-SPECTROMETRY (SIMS) ON CORRODED STEEL SURFACES

被引:4
|
作者
WU, YL [1 ]
PULHAM, RJ [1 ]
BARKER, MG [1 ]
机构
[1] UNIV NOTTINGHAM,DEPT CHEM,NOTTINGHAM NG7 2RD,ENGLAND
关键词
D O I
10.1016/0022-3115(90)90006-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The steel AISI 316 is inert to the tritium breeders Li2O, Li2SiO3 and metallic Li except in the presence of impurities or at very high temperatures. Under these conditions the steel can be corroded severely, and SIMS is uniquely suitable for detecting the Li distribution. Corroded steel surfaces have been analysed by SIMS, and when the technique is complemented by Scanning Electron Microscopy with Energy Dispersive X-ray Analysis (SEM/EDAX), and X-Ray Diffraction (XRD), it is seen that both solid (Li2O, Li2SiO3) and liquid (Li) potential tritium breeders (for fusion devices) corrode the steel similarly. The steel is penetrated by Li+ ions together with the corresponding anions via grain boundaries and Cr is extracted from the grains to give Cr-depleted steel (= Fe Ni). A stable ternary compound (LiCrO2 with Li2O and Li2SiO3; Li9CrN5 with Li/Li3N) is formed in the grain boundaries and also as a layer on the steel surface. This type of corrosion alters the surface composition of the steel and the intergranular penetration is the precursor to steel fracture. © 1990.
引用
收藏
页码:31 / 36
页数:6
相关论文
共 50 条
  • [41] SECONDARY ION MASS-SPECTROMETRY (SIMS) OF METAL-SURFACES UNDER OXYGEN .2. SPUTTERING YIELDS
    KLOPPEL, KD
    BRUDNY, MM
    VONBUNAU, G
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1986, 68 (1-2): : 25 - 34
  • [42] X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS) AND SECONDARY ION MASS-SPECTROMETRY (SIMS) OF CATALYST SURFACES
    DELGASS, WN
    CRILEY, DF
    GUTMAN, A
    KOSTKA, WD
    STANFIELD, RM
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1980, 180 (AUG): : 102 - COLL
  • [43] APPLICATIONS OF SECONDARY ION MASS-SPECTROMETRY (SIMS) IN BIOLOGICAL-RESEARCH - A REVIEW
    BURNS, MS
    JOURNAL OF MICROSCOPY-OXFORD, 1982, 127 (SEP): : 237 - 258
  • [44] STATIC SECONDARY ION MASS-SPECTROMETRY (SIMS) OF POLYANILINES - A PRELIMINARY-STUDY
    CHAN, HSO
    ANG, SG
    HO, PKH
    JOHNSON, D
    SYNTHETIC METALS, 1990, 36 (01) : 103 - 110
  • [45] CHARACTERIZATION OF RUBBER SURFACES BY STATIC SECONDARY ION MASS-SPECTROMETRY
    VANOOIJ, WJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1990, 199 : 52 - MACRO
  • [46] SECONDARY ION MASS-SPECTROMETRY
    VICKERMAN, JC
    CHEMISTRY IN BRITAIN, 1987, 23 (10) : 969 - &
  • [47] INVESTIGATION OF THE DEUTERIUM SOLUBILITY IN NIOBIUM USING SECONDARY ION MASS-SPECTROMETRY (SIMS)
    ZUCHNER, H
    BRUNING, T
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1991, 341 (1-2): : 150 - 153
  • [48] HIGH-RESOLUTION SECONDARY ION MASS-SPECTROMETRY (SIMS) FOR USE IN CHEMISTRY
    KLOPPEL, KD
    VONBUNAU, G
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 39 (01): : 85 - 93
  • [49] SECONDARY ION MASS-SPECTROMETRY
    HEDBAVNY, P
    CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1974, 24 (04): : C396 - 397
  • [50] SECONDARY ION MASS-SPECTROMETRY
    CAVALLINI, M
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1982, 7 (03): : A50 - A50