ZERO-TEMPERATURE-COEFFICIENT (ZTC) BIASING OF POWER VDMOS TRANSISTORS

被引:8
|
作者
PRIJIC, Z
PAVLOVIC, Z
RISTIC, S
STOJADINOVIC, N
机构
[1] Faculty of Electronic Engineering, University of Niš, Beogradska 14
关键词
TRANSISTORS; FIELD-EFFECT TRANSISTORS; SEMICONDUCTOR DEVICES AND MATERIALS;
D O I
10.1049/el:19930291
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is shown that, in contrast to conventional MOSFETs, power VDMOS transistors exhibit a unique ZTC point only in the saturation region of operation. Also, an analytical expression for the ptc voltage for the ZTC biasing or power VDMOS transistors, leading to excellent agreement with experimental data, is derived.
引用
收藏
页码:435 / 437
页数:3
相关论文
共 50 条
  • [21] ELECTROTHERMAL SIMULATION OF POWER VDMOS TRANSISTORS
    MAWBY, PA
    ZENG, J
    BOARD, K
    INTERNATIONAL JOURNAL OF NUMERICAL METHODS FOR HEAT & FLUID FLOW, 1995, 5 (02) : 185 - 192
  • [22] Drain current zero-temperature-coefficient point for CMOS temperature-voltage converter operating in strong inversion
    Ikeda, H
    Takakubo, K
    Takakubo, H
    IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2004, E87A (02) : 370 - 375
  • [23] CMOS zero-temperature-coefficient point voltage reference with variable-output-voltage level
    Ikeda, H
    Takakubo, K
    Takakubo, H
    IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2005, E88A (02) : 476 - 482
  • [24] Using Zero Thermal Coefficient point property for VDMOS power devices health monitoring
    Marcault, E.
    Bourennane, A.
    Breil, M.
    Tounsi, P.
    Dupuy, P.
    2012 24TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD), 2012, : 133 - 136
  • [25] A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors
    Prijic, A.
    Dankovic, D.
    Vracar, Lj
    Manic, I.
    Prijic, Z.
    Stojadinovic, N.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2012, 23 (08)
  • [26] THE DETERMINATION OF ZERO TEMPERATURE-COEFFICIENT POINT IN CMOS TRANSISTORS
    PRIJIC, ZD
    DIMITRIJEV, SS
    STOJADINOVIC, ND
    MICROELECTRONICS RELIABILITY, 1992, 32 (06) : 769 - 773
  • [27] Ground plane influence on Zero-Temperature-Coefficient in SOI UTBB MOSFETs with different silicon film thicknesses
    Macambira, Christian N.
    Itocazu, Vitor T.
    Almeida, Luciano M.
    Martino, Joao A.
    Simoen, Eddy
    Claeys, Cor
    2016 31ST SYMPOSIUM ON MICROELECTRONICS TECHNOLOGY AND DEVICES (SBMICRO), 2016,
  • [28] Electrothermal Small-Signal Model of Nanosheet FETs With Zero-Temperature-Coefficient Based Parameters Extraction Method
    Lyu, Yaoyang
    Chen, Wangyong
    Cai, Linlin
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (07) : 4153 - 4159
  • [29] Zero-temperature-coefficient of capacitance in BaTiO3/PI composite films using paraffin as barrier layer
    Pu, Linyu
    Li, Yu
    Tang, Jingyuan
    Long, Yiting
    Wang, Wei
    Dai, Yatang
    Huang, Xu
    POLYMER COMPOSITES, 2023, 44 (05) : 2757 - 2765
  • [30] ANALYSIS OF THERMAL-CHARACTERISTICS OF VDMOS POWER TRANSISTORS
    LI, ZJ
    CHEN, XB
    YU, HQ
    SOLID-STATE ELECTRONICS, 1991, 34 (03) : 225 - 231