THE PROFILE OF LAYERED MATERIALS REFLECTED BY GLANCING-INCIDENCE X-RAY-ANALYSIS

被引：0

作者：

DEBOER, DKG ^{[1
]}

LEENAERS, AJG ^{[1
]}

VANDENHOOGENHOF, WW ^{[1
]}

机构：

[1] PHILIPS ANALYT X-RAY BV,7602 EA ALMELO,NETHERLANDS

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1994年 / 58卷 / 03期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Specular reflectivity, diffuse scattering at glancing incidence and angle-dependent total-reflection X-ray fluorescence are complementary techniques for the investigation of layered materials. The principles of these glancing-incidence X-ray methods are briefly discussed. Examples show the strength of the combination of these techniques.

引用

页码：169 / 172

页数：4

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