共 50 条
- [1] Evaluation of Ni/Mn multilayer samples with glancing incidence and take-off X-ray fluorescence analysisAPPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1996, 62 (02): : 87 - 93Sato, STsuji, KHirokawa, K
- [3] Glancing-incidence and glancing-takeoff X-ray fluorescence analysis of a Mn ultrathin film on an Au layerTHIN SOLID FILMS, 1996, 274 (1-2) : 18 - 22Tsuji, KSato, SHirokawa, K
- [4] Development of glancing-incidence and glancing-take-off X-ray fluorescence apparatus for surface and thin-film analysesSPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1997, 52 (07) : 841 - 846Tsuji, KWagatsuma, KHirokawa, KYamada, TUtaka, T
- [5] Glancing-incidence and glancing-takeoff x-ray fluorescence analysis of Ni-GaAs interface reactionsX-RAY SPECTROMETRY, 2000, 29 (02) : 155 - 160Tsuji, KWagatsuma, KOku, T
- [6] Nondestructive depth profiling by glancing-incidence and -takeoff X-ray fluorescenceMATERIALS TRANSACTIONS JIM, 1996, 37 (03): : 295 - 298Tsuji, KSato, SHirokawa, K
- [7] GLANCING-INCIDENCE X-RAY-ANALYSISSPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1993, 48 (02) : 277 - 284VANDENHOOGENHOF, WWDEBOER, DKG
- [8] X-RAY FLUORESCENCE ANALYSIS WITH VARIABLE TAKE-OFF GEOMETRYMIKROCHIMICA ACTA, 1970, : 280 - &EBEL, H
- [9] GLANCING-INCIDENCE X-RAY-FLUORESCENCE OF LAYERED MATERIALSPHYSICAL REVIEW B, 1991, 44 (02): : 498 - 511DEBOER, DKG
- [10] TAKE-OFF ANGLE-DEPENDENT X-RAY-FLUORESCENCE OF THIN-FILMS AT GLANCING INCIDENCESPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1993, 48 (12) : 1471 - 1480TSUJI, KHIROKAWA, K