Evaluation of Ni/Mn multilayer samples with glancing-incidence and take-off X-ray fluorescence analysis

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作者：
Sato, S. [1 ]
Tsuji, K. [1 ]
Hirokawa, K. [1 ]
机构：
[1] Tohoku Univ, Sendai, Japan
来源：
Applied Physics A: Materials Science and Processing | / 62卷 / 02期
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页码：87 / 93
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