DETERMINATION OF THE DEPTH RESOLUTION IN AUGER DEPTH PROFILING MEASUREMENTS

被引:17
|
作者
ROLL, K
HAMMER, C
机构
关键词
D O I
10.1016/0040-6090(79)90150-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:209 / 212
页数:4
相关论文
共 50 条
  • [41] AUGER DEPTH PROFILING OF MNOS STRUCTURES BY ION SPUTTERING
    JOHANNESSEN, JS
    HELMS, CR
    SPICER, WE
    STRAUSSER, YE
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (05) : 547 - 551
  • [42] Depth resolution in sputter profiling revisited
    Hofmann, S.
    Liu, Y.
    Jian, W.
    Kang, H. L.
    Wang, J. Y.
    SURFACE AND INTERFACE ANALYSIS, 2016, 48 (13) : 1354 - 1369
  • [43] Considerable Improvement of Depth Resolution in Auger Sputter Depth Profiling of Polycrystalline Thin Films Using In-situ Sample Preparation Methods
    Scheithauer, U.
    ANALYTICAL TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND PROCESS CHARACTERIZATION 6 (ALTECH 2009), 2009, 25 (03): : 103 - 117
  • [44] Influence of nonstationary atomic mixing on depth resolution in sputter depth profiling
    Wang, J. Y.
    Liu, Y.
    Hofmann, S.
    Kovac, J.
    SURFACE AND INTERFACE ANALYSIS, 2012, 44 (05) : 569 - 572
  • [45] Towards quantitative depth profiling with high spatial and high depth resolution
    Vanhove, N.
    Lievens, P.
    Vandervorst, W.
    APPLIED SURFACE SCIENCE, 2008, 255 (04) : 1360 - 1363
  • [46] On the use of model depth resolution function for the deconvolution of depth profiling data
    Makarov, V.V.
    Poverkhnost Fizika Khimiya Mekhanika, 1994, (03): : 58 - 64
  • [47] Optimization of the depth resolution for deuterium depth profiling up to large depths
    Wielunska, B.
    Mayer, M.
    Schwarz-Selinger, T.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2016, 387 : 103 - 114
  • [48] Influence of surface roughness on the depth resolution of GDOES depth profiling analysis
    Shimizu, K
    Brown, GM
    Habazaki, H
    Kobayashi, K
    Skeldon, P
    Thompson, GE
    Wood, GC
    SURFACE AND INTERFACE ANALYSIS, 1999, 27 (03) : 153 - 156
  • [49] DEPTH PROFILING BY SIMS DEPTH RESOLUTION, DYNAMIC-RANGE AND SENSITIVITY
    MAGEE, CW
    HONIG, RE
    SURFACE AND INTERFACE ANALYSIS, 1982, 4 (02) : 35 - 41
  • [50] DEPTH RESOLUTION IMPROVEMENTS USING SPECIMEN ROTATION DURING DEPTH PROFILING
    GELLER, JD
    VEISFELD, N
    SURFACE AND INTERFACE ANALYSIS, 1989, 14 (1-2) : 95 - 98