X-RAY CRYSTAL TRUNCATION ROD SCATTERING - GENERAL INTENSITY FORMULA FOR NO LATERAL DISPLACEMENTS OF SURFACE ATOMS

被引：4
|
作者：
KASHIHARA, Y
机构：
[1] Department of Applied Physics, Nagoya University, 464, Chikusa-ku Nagoya
来源：
SURFACE SCIENCE | 1990年 / 232卷 / 03期
关键词：
D O I：
10.1016/0039-6028(90)90135-U
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We present a fundamental formula to analyze the X-ray intensity distributions along the crystal truncation rod (CTR) scattered from the surface of a crystal. By introducing the model functions for the surface roughness and the lattice distortion near the surface, we provide general analytical methods for determining the surface structure from the CTR scattering. These methods can be used for the investigation of intensity profiles of the CTR scattering observed around any Bragg point. © 1990.
引用
收藏
页码：417 / 425
页数：9
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