X-RAY CRYSTAL TRUNCATION ROD SCATTERING - GENERAL INTENSITY FORMULA FOR NO LATERAL DISPLACEMENTS OF SURFACE ATOMS

被引：4
|
作者：
KASHIHARA, Y
机构：
[1] Department of Applied Physics, Nagoya University, 464, Chikusa-ku Nagoya
来源：
SURFACE SCIENCE | 1990年 / 232卷 / 03期
关键词：
D O I：
10.1016/0039-6028(90)90135-U
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We present a fundamental formula to analyze the X-ray intensity distributions along the crystal truncation rod (CTR) scattered from the surface of a crystal. By introducing the model functions for the surface roughness and the lattice distortion near the surface, we provide general analytical methods for determining the surface structure from the CTR scattering. These methods can be used for the investigation of intensity profiles of the CTR scattering observed around any Bragg point. © 1990.
引用
收藏
页码：417 / 425
页数：9
相关论文
共 50 条
  • [21] ATOMIC-LEVEL INTERFACE STRUCTURE OF INP/INPAS/INP MEASURED BY X-RAY CRYSTAL TRUNCATION ROD SCATTERING
    TABUCHI, M
    TAKEDA, Y
    SAKURABA, Y
    KUMAMOTO, T
    FUJIBAYASHI, K
    TAKAHASHI, I
    HARADA, J
    KAMEI, H
    JOURNAL OF CRYSTAL GROWTH, 1995, 146 (1-4) : 148 - 152
  • [22] Structure of a Bi/Bi2Te3 heteroepitaxial film studied by x-ray crystal truncation rod scattering
    Shirasawa, Tetsuroh
    Tsunoda, Junichi
    Hirahara, Toru
    Takahashi, Toshio
    PHYSICAL REVIEW B, 2013, 87 (07):
  • [23] X-RAY CRYSTAL TRUNCATION ROD SCATTERING MEASUREMENT OF ASH3-EXPOSED INP/INPAS/INP SINGLE HETEROSTRUCTURES
    TAKEDA, Y
    SAKURABA, Y
    FUJIBAYASHI, K
    TABUCHI, M
    KUMAMOTO, T
    TAKAHASHI, I
    HARADA, J
    KAMEI, H
    APPLIED PHYSICS LETTERS, 1995, 66 (03) : 332 - 334
  • [24] X-ray crystal truncation rod scattering measurement of AsH3-exposed InP/InPAs/InP single heterostructures
    Appl Phys Lett, 3 (332):
  • [25] X-RAY CRYSTAL TRUNCATION ROD SCATTERING FROM MBE GROWN (CAF2-SRF2)/SI(111) SUPERLATTICES
    HARADA, J
    ITOH, Y
    SHIMURA, T
    TAKAHASHI, I
    ALVAREZ, JC
    SOKOLOV, NS
    APPLIED SURFACE SCIENCE, 1994, 75 : 263 - 268
  • [26] Theoretical description of the intensity of crystal-truncation-rod scattering modulated by a Bragg reflection
    Yashiro, W.
    BURIED INTERFACE SCIENCES WITH X-RAYS AND NEUTRONS 2010, 2011, 24
  • [27] X-RAY SCATTERING FACTORS OF COMPRESSED ATOMS
    Taverner, B. Craig
    Boeyens, Jan C. A.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C356 - C356
  • [28] The appearance of atoms as determined by x-ray scattering
    Wollan, EO
    Compton, AH
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1934, 24 (09) : 229 - 233
  • [29] Determination of composition distributions in InP/InGaAs/InP quantum-well structures by X-ray crystal truncation rod scattering and quantum levels
    Tabuchi, M
    Fujibayashi, K
    Yamada, N
    Hagiwara, K
    Kobashi, A
    Iguchi, T
    Takeda, Y
    Kamei, H
    JOURNAL OF CRYSTAL GROWTH, 1998, 186 (1-2) : 48 - 54
  • [30] Determination of composition distributions in InP/InGaAs/InP quantum-well structures by X-ray crystal truncation rod scattering and quantum levels
    Tabuchi, M.
    Fujibayashi, K.
    Yamada, N.
    Hagiwara, K.
    Kobashi, A.
    Iguchi, T.
    Takeda, Y.
    Kamei, H.
    1998, Elsevier Sci B.V., Amsterdam, Netherlands (186) : 1 - 2
12345