LOW-ENERGY ELECTRON-MICROSCOPY (LEEM) AND PHOTOEMISSION MICROSCOPY (PEEM) OF SEMICONDUCTOR SURFACES

被引：0
|
作者：
BAUER, E
MUNDSCHAU, M
SWIECH, W
TELIEPS, W
机构：
来源：
EVALUATION OF ADVANCED SEMICONDUCTOR MATERIALS BY ELECTRON MICROSCOPY | 1989年 / 203卷
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：283 / 294
页数：12
相关论文
共 50 条
  • [1] SURFACE STUDIES BY LOW-ENERGY ELECTRON-MICROSCOPY (LEEM) AND CONVENTIONAL UV PHOTOEMISSION ELECTRON-MICROSCOPY (PEEM)
    BAUER, E
    MUNDSCHAU, M
    SWIECH, W
    TELIEPS, W
    ULTRAMICROSCOPY, 1989, 31 (01) : 49 - 57
  • [2] LOW-ENERGY ELECTRON-MICROSCOPY (LEEM)
    BAUER, E
    MUNDSCHAU, M
    SWIECH, W
    TELIEPS, W
    ULTRAMICROSCOPY, 1990, 32 (02) : 188 - 188
  • [3] LOW-ENERGY ELECTRON-MICROSCOPY OF SEMICONDUCTOR SURFACES
    BAUER, E
    MUNDSCHAU, M
    SWIECH, W
    TELIEPS, W
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 1007 - 1013
  • [4] Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)
    Foerster, Michael
    de la Figuera, Juan
    Palacio, Irene
    Aballe, Lucia
    ULTRAMICROSCOPY, 2024, 258
  • [5] LOW-ENERGY ELECTRON-MICROSCOPY OF SURFACES
    TELIEPS, W
    BAUER, E
    SURFACE SCIENCE, 1988, 200 (2-3) : 512 - 513
  • [6] LOW-ENERGY ELECTRON-MICROSCOPY
    BAUER, E
    TELIEPS, W
    SCANNING MICROSCOPY, 1987, : 99 - 108
  • [7] LOW-ENERGY ELECTRON-MICROSCOPY
    BAUER, E
    MUNDSCHAU, M
    SWIECH, W
    TELIEPS, W
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 213 - 218
  • [8] LOW-ENERGY ELECTRON-MICROSCOPY
    BAUER, E
    MUNDSCHAU, M
    SWIECH, W
    TELIEPS, W
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 213 - 218
  • [9] LOW-ENERGY ELECTRON-MICROSCOPY
    BAUER, E
    TELIEPS, W
    TURNER, G
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 573 - 574
  • [10] INITIAL EPITAXIAL-GROWTH OF CU ON MO(011) BY LOW-ENERGY ELECTRON-MICROSCOPY AND PHOTOEMISSION ELECTRON-MICROSCOPY
    MUNDSCHAU, M
    BAUER, E
    SWIECH, W
    JOURNAL OF APPLIED PHYSICS, 1989, 65 (02) : 581 - 584
12345