SURFACE STUDIES BY LOW-ENERGY ELECTRON-MICROSCOPY (LEEM) AND CONVENTIONAL UV PHOTOEMISSION ELECTRON-MICROSCOPY (PEEM)

被引：95

作者：

BAUER, E ^{[1
]}

MUNDSCHAU, M ^{[1
]}

SWIECH, W ^{[1
]}

TELIEPS, W ^{[1
]}

机构：

[1] SFB 126,D-3392 CLAUSTHAL ZELLERFE,FED REP GER

来源：

ULTRAMICROSCOPY | 1989年 / 31卷 / 01期

关键词：

D O I：

10.1016/0304-3991(89)90033-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：49 / 57

页数：9

共 22 条

[1] THE RESOLUTION OF THE LOW-ENERGY ELECTRON REFLECTION MICROSCOPE [J].

BAUER, E .

ULTRAMICROSCOPY, 1985, 17 (01) :51-56

[2]

Bauer E., 1988, Physikalische Blaetter, V44, P255

[3]

BAUER E, 1988, EVALUATION ADV SEMIC

[4]

BAUER E, 1988, REFLECTION HIGH ENER, P381

[5]

BAUER E, 1987, SCANNING MICROSCOP S, V1, P99

[6]

BAUER E, 1988, STUDY SURFACES INTER, P195

[7] A VERY LOW-ENERGY ELECTRON REFLECTION STUDY OF HYDROGEN ADSORPTION ON W(100) AND W(110) SURFACES [J].

HERLT, HJ ;

BAUER, E .

SURFACE SCIENCE, 1986, 175 (02) :336-368

[8] EXPERIMENT AND THEORY OF THE ELASTIC ELECTRON REFLECTION COEFFICIENT FROM TUNGSTEN [J].

HERLT, HJ ;

FEDER, R ;

MEISTER, G ;

BAUER, EG .

SOLID STATE COMMUNICATIONS, 1981, 38 (10) :973-976

[9] MODIFICATION OF ATOMIC STEPS BY ADSORBATES OBSERVED BY LOW ENERGY ELECTRON MICROSCOPY AND PHOTOEMISSION MICROSCOPY [J].

Mundschau, M. ;

Bauer, E. ;

Swiech, W. .

CATALYSIS LETTERS, 1988, 1 (11) :405-411

[10] PHOTOEMISSION MICROSCOPY AND ATOMIC STEPS ON MO(011) [J].

MUNDSCHAU, M ;

BAUER, E ;

SWIECH, W .

SURFACE SCIENCE, 1988, 203 (03) :412-422

← 1 2 3 →