LOW-ENERGY ELECTRON-MICROSCOPY (LEEM) AND PHOTOEMISSION MICROSCOPY (PEEM) OF SEMICONDUCTOR SURFACES

被引：0
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作者：
BAUER, E
MUNDSCHAU, M
SWIECH, W
TELIEPS, W
机构：
来源：
EVALUATION OF ADVANCED SEMICONDUCTOR MATERIALS BY ELECTRON MICROSCOPY | 1989年 / 203卷
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TH742 [显微镜];
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页码：283 / 294
页数：12
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