共 50 条
- [23] Sub-nanometer scale measurements of silicon oxide thickness by spectroscopic ellipsometry JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1998, 37 (11B): : L1418 - L1420
- [24] Study on measurement of thickness and refractive index of rough surface films by using ellipsometry Guangxue Jishu/Optical Technique, 1995, (03): : 18 - 20
- [25] INLINE THICKNESS MEASUREMENT ON DIELECTRIC LAYERS ON METALLIC SUBSTRATES WITH IR-ELLIPSOMETRY 6. TAGUNG INNOVATION MESSTECHNIK, 2019, : 101 - 103
- [26] Application of backscattering spectrometry for composition and thickness determination of zirconium oxide layers on autoclaved zircaloy Journal of Radioanalytical and Nuclear Chemistry, 2005, 265 : 441 - 446
- [28] ELLIPSOMETRY AND THICKNESS OF SURFACE LAYERS DOKLADY AKADEMII NAUK SSSR, 1969, 187 (03): : 619 - &
- [29] Measurement of thin oxide films on implanted Si-substrate by ellipsometry Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1994, 33 (4 A): : 2031 - 2034