ZIRCALOY OXIDE THICKNESS MEASUREMENT BY ELLIPSOMETRY

被引:5
|
作者
PENG, YK
BASHARA, NM
机构
关键词
D O I
10.1016/0022-3115(80)90115-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:306 / 312
页数:7
相关论文
共 50 条
  • [1] OPTICAL-PROPERTIES OF ZIRCALOY AND ZIRCALOY OXIDE BY ELLIPSOMETRY
    BASHARA, NM
    PENG, YK
    APPLIED OPTICS, 1980, 19 (18): : 3245 - 3251
  • [2] THIN-OXIDE THICKNESS MEASUREMENT IN ELLIPSOMETRY BY A WAFER ROTATION METHOD
    HWU, JG
    HO, IH
    CHOU, SP
    SOLID-STATE ELECTRONICS, 1990, 33 (10) : 1327 - 1328
  • [3] OXIDE THICKNESS MEASUREMENTS BY IR ELLIPSOMETRY
    ALLEN, TH
    SUNDERLAND, RJ
    THIN SOLID FILMS, 1977, 45 (01) : 169 - 182
  • [4] Inline thickness measurement with imaging-ellipsometry
    Bammer, Ferdinand
    Huemer, Florian
    PHOTONICS AND EDUCATION IN MEASUREMENT SCIENCE, 2019, 11144
  • [5] Extraction of optical properties and thickness of silicon-rich oxide films from ellipsometry measurement
    Lin, Shu
    Wurfl, Ivan Perez
    Feng, Yu
    THIN FILM SOLAR TECHNOLOGY IV, 2012, 8470
  • [6] EPITAXIAL LAYER THICKNESS MEASUREMENT BY FAR INFRARED ELLIPSOMETRY
    DENICOLA, RO
    SAIFI, MA
    FRAZEE, RE
    APPLIED OPTICS, 1972, 11 (11): : 2534 - &
  • [7] Coaxial spectroscopic imaging ellipsometry for volumetric thickness measurement
    Lee, Seung Woo
    Choi, Garam
    Lee, Sin Yong
    Cho, Yeongchan
    Pahk, Heui Jae
    APPLIED OPTICS, 2021, 60 (01) : 67 - 74
  • [8] MEASURING THE THICKNESS OF OXIDE ON POLYSILICON USING ULTRAVIOLET ELLIPSOMETRY
    TOMPKINS, HG
    VASQUEZ, B
    MATHIS, T
    YETTER, G
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (06) : 1772 - 1777
  • [9] Thickness and refractivity computation in ellipsometry measurement by genetic algorithm
    Peng, ZL
    Li, ZY
    Hu, Y
    Tang, LG
    Yang, XF
    INTERNATIONAL CONFERENCE ON SENSORS AND CONTROL TECHNIQUES (ICSC 2000), 2000, 4077 : 492 - 495
  • [10] ELLIPSOMETRY OF ANODE OXIDE-FILMS OF VARIABLE THICKNESS ON INSB
    ANTONYUK, VN
    MATSAS, EP
    MOZDOR, EV
    SNITKO, OV
    CHAIKIN, VI
    UKRAINSKII FIZICHESKII ZHURNAL, 1980, 25 (02): : 285 - 291