LOW-ABSORPTION MEASUREMENT OF OPTICAL THIN-FILMS USING THE PHOTOTHERMAL SURFACE-DEFORMATION TECHNIQUE

被引：13
|
作者：
WELSCH, E
WALTHER, HG
ECKARDT, P
LAN, T
机构：
来源：
CANADIAN JOURNAL OF PHYSICS | 1988年 / 66卷 / 07期
关键词：
D O I：
10.1139/p88-106
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：638 / 644
页数：7
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